About this Forum:
The rapid evolution of communications satellites, automotive RF sensing, AI-driven compute infrastructure, and other high-frequency platforms is accelerating the shift toward higher operating frequencies and wider bandwidths. As frequencies increase, accurate characterization of low-loss dielectric materials becomes essential for board, antenna, and transceiver design. In this presentation, we’ll discuss material measurement solutions for extracting permittivity from low-loss dielectrics using cavity/resonator-based fixtures, including an overview of how the different methods work.
The Rodgers RLE Forum is a time to appreciate and learn from examples of impactful engineering. The laboratory hosts these opportunities for engagement in support of its mission to serve as a cutting-edge hub for advancing and sharing knowledge and best practices in high-performance prototyping.
About the presenters:
Nick Caira is a RD/Microwave Solutions Engineer with Keysight Technologies. He specializes in material measurements solutions and supports vector network analyzers and impedance analyzers. Nick has over a decade of material measurement experience and received his PhD in ECE from Duke University where he researched metamaterials and metasurfaces.
Kyle Richard is an Account Manager / Field Engineer for Keysight Technologies serving the Boston Area. Specializing in Keysight’s electronic test and measurement equipment for industries such as IoT, Automotive, Communications, Aerospace and Defense, and more.
